1504-120E View Datasheet(PDF) - Data Delay Devices
Part Name
Description
MFG CO.
'1504-120E' PDF : 2 Pages View PDF
1
2
1504
16 15 14 13 12 11 10 9
Lead Material:
Nickel-Iron alloy 42
TIN PLATE
12345678
.900 MAX.
.280
MAX.
.290
MAX.*
*.320 MAX for delays
larger than 500ns
.018
TYP.
.700±.010
7 Equal spaces
each .100±.010
Non-Accumulative
.015 TYP.
.070 MAX.
.010±.002
.350
MAX.
Package Dimensions
PASSIVE DELAY LINE TEST SPECIFICATIONS
TEST CONDITIONS
INPUT:
Ambient Temperature:
Input Pulse:
Source Impedance:
Rise/Fall Time:
Pulse Width
Period
Pulse Width
Period
(TD <= 75ns):
(TD <= 75ns):
(TD > 75ns):
(TD > 75ns):
25oC ± 3oC
High = 3.0V typical
Low = 0.0V typical
50Ω Max.
3.0 ns Max. (measured
at 10% and 90% levels)
PWIN = 100ns
PERIN = 1000ns
PWIN = 2 x TD
PERIN = 10 x TD
OUTPUT:
Rload:
Cload:
Threshold:
10MΩ
10pf
50% (Rising & Falling)
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
INPUT
SIGNAL
OUTPUT
SIGNAL
TRISE
PWIN
PERIN
TFALL
90%
VIH
90%
50%
10%
50%
10%
VIL
DRISE
TRISE
DFALL
90%
50%
10%
VOH
90%
50%
10%
TFALL
VOL
Timing Diagram For Testing
PULSE
GENERATOR
OUT
TRIG
RIN
50 Ω
IN DEVICE UNDER OUT
TEST (DUT)
RIN = ROUT = ZLINE
ROUT
IN
TRIG
OSCILLOSCOPE
Test Setup
Doc #01006
DATA DELAY DEVICES, INC.
2
10/30/01
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com
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