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30EPH03 View Datasheet(PDF) - Thinki Semiconductor Co., Ltd.

Part Name
Description
MFG CO.
30EPH03
THINKISEMI
Thinki Semiconductor Co., Ltd. THINKISEMI
'30EPH03' PDF : 3 Pages View PDF
1 2 3
30EPH03
Electrical characteristics (Ta=25°C unless otherwise specified)
Parameter
Symbol
Test Conditions
Min
Breakdown voltage VBR,
Blocking voltage
VR
IR=100µA
300
Forward voltage
(Per Diode)
VF
IF=30A
IF=30A, Tj =125°C
Reverse leakage
current(Per Diode)
IR
VR= VRRM
Tj=150°C, VR=300V
Reverse recovery
time(Per Diode)
IF=0.5A, IR=1A, IRR=0.25A
trr
IF=1A,VR=30V, di/dt =200A/us
Typ. Max. Units
0.96 1.20
V
0.85 1.00
10
µA
100
35
45
ns
26
40
Thermal characteristics
Paramter
Junction-to-Case
Symbol
RθJC
Typ
Units
0.8
/W
Electrical performance (typic)
Rev.08T
© 1995 Thinki Semiconductor Co., Ltd.
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http://www.thinkisemi.com.tw/
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