A29L400ATG-90IF View Datasheet(PDF) - AMIC Technology
Part Name
Description
MFG CO.
A29L400ATG-90IF
AMIC Technology
'A29L400ATG-90IF' PDF : 38 Pages View PDF
A29L400A Series
Erase and Programming Performance
Parameter
Sector Erase Time
Chip Erase Time
Byte Programming Time
Word Programming Time
Chip Programming Time
(Note 3)
Byte Mode
Word Mode
Typ. (Note 1)
1.0
10
5
7
7
5
Max. (Note 2)
8
300
500
18
12
Unit
Comments
sec Excludes 00h programming prior
sec to erasure
µs
µs Excludes system-level overhead
sec (Note 5)
sec
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 3.0V VCC, 10,000 cycles. Additionally, programming
typically assumes checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 2.7V, 100,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum byte program time listed. If the maximum byte program time given is exceeded, only then
does the device set I/O5 = 1. See the section on I/O5 for further information.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See Table 5
for further information on command definitions.
6. The device has a guaranteed minimum erase and program cycle endurance of 10,000 cycles.
Latch-up Characteristics
Description
Input Voltage with respect to VSS on all I/O pins
VCC Current
Input voltage with respect to VSS on all pins except I/O pins
(including A9, OE and RESET )
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at time.
Min.
-1.0V
-100 mA
-1.0V
Max.
VCC+1.0V
+100 mA
12.5V
TSOP and SOP Pin Capacitance
Parameter Symbol
Parameter Description
CIN
Input Capacitance
COUT
Output Capacitance
CIN2
Control Pin Capacitance
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0MHz
Data Retention
Parameter
Minimum Pattern Data Retention Time
Test Setup
VIN=0
VOUT=0
VIN=0
Typ.
6
8.5
7.5
Max.
7.5
12
9
Unit
pF
pF
pF
Test Conditions
Min
150°C
10
125°C
20
Unit
Years
Years
PRELIMINARY (July, 2005, Version 0.0)
31
AMIC Technology, Corp.
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