AN2064 View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
'AN2064' PDF : 14 Pages View PDF
AN2064 - APPLICATION NOTE
Figure 11 shows the measurement circuit used for this test series. During lightning and mains contact
tests, the surge current (I surge) injected in Tip L or Ring L (transversal tests) or both Tip L and Ring L
(longitudinal tests) has been measured. The remaining voltages at Tip S or Ring S have been also
measured (V).
Figure 11: Measurement circuit
Surge
Generator
I surge
Line side
DUT
Protected device side
V
Oscilloscope
Current probe
Voltage probe
The curves of the figures 12, 13 and 14 show the results, respectively, of :
- a case of lightning test
- a case of first level AC power fault test
- a case of second level AC power fault test.
These curves show no impact of both fuses and TRISIL during first level tests while the fuses open safely
during certain second level tests.
Figure 12: Module behavior during 2/10µs 500A surge test
I surge (100A/div)
V (50V/div)
11/14
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