APL1582
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Description
245°C , 5 SEC
1000 Hrs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-65°C ~ 150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
Carrier Tape & Reel Dimension
t
E
Po
P
D
P1
F
Bo
W
Ao
D1
Ko
T2
J
C
A
B
T1
Application A
330 ±3
TO-252
F
B
100 ± 2
D
C
13 ± 0. 5
D1
J
2 ± 0.5
Po
T1
T2
16.4 + 0.3
-0.2
2.5± 0.5
P1
Ao
W
16+ 0.3
- 0.1
Bo
P
8 ± 0.1
Ko
E
1.75± 0.1
t
7.5 ± 0.1
Application A
380±3
TO-263
F
1.5 +0.1 1.5± 0.25 4.0 ± 0.1
B
C
J
80 ± 2 13 ± 0. 5 2 ± 0.5
D
D1
Po
2.0 ± 0.1
T1
24 ± 4
P1
6.8 ± 0.1 10.4± 0.1 2.5± 0.1
T2
2± 0.3
Ao
W
24 + 0.3
- 0.1
Bo
P
16 ± 0.1
Ko
0.3±0.05
E
1.75± 0.1
t
11.5 ± 0.1 1.5 +0.1 1.5± 0.25 4.0 ± 0.1 2.0 ± 0.1 10.8 ± 0.1 16.1± 0.1 5.2± 0.1 0.35±0.013
Copyright ANPEC Electronics Corp.
12
Rev. A.4 - Apr., 2003
(mm)
www.anpec.com.tw