CD22100F View Datasheet(PDF) - Harris Semiconductor
Part Name
Description
MFG CO.
CD22100F
Harris Semiconductor
'CD22100F' PDF : 9 Pages View PDF
Metallization Mask Layout
CD22100
Dimensions in parenthesis are in millimeters and are derived
from the basic inch dimensions as indicated. Grid graduations
are in mils (10-3 inch).
Test Circuits and Waveforms
VDD
1
2
VSS
3
4
5
6
7
VSS
8
VDD
IDD
16
15
14
13
12
11
10
9
VDD
1
II
2
VSS
3
4
5
6
7
8
VSS
VDD
16
15
14
NOTE:
MEASURE INPUTS
13
SEQUENTIALLY TO
12
BOTH VDD AND VSS
CONNECT ALL UNUSED
11
INPUTS TO EITHER
10
VDD OR VSS
9
FIGURE 1. QUIESCENT CURRENT TEST CIRCUIT
FIGURE 2. INPUT CURRENT TEST CIRCUIT
VDD
VDD
IDD
1
16
2
15
3
14
4
13
5
12
6
11
7
10
8
9
VSS
FIGURE 3. OFF SWITCH INPUT OR OUTPUT LEAKAGE CURRENT TEST CIRCUIT
4-189
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