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CLP200M View Datasheet(PDF) - STMicroelectronics

Part Name
Description
MFG CO.
'CLP200M' PDF : 21 Pages View PDF
CLP200M
Fig. 26 : Induction test behavior (Test 3b).
Fig. 28 : Power contact test 3 (with R ® 10 series).
duct(s) 3.3.3 - Power contact test (Test 3 table 1/K20)
ro The test 3 of CCITT K20 requires a serial PTC (or
P fuse) which is inserted in the test circuit to limit the
current rate. This PTC acts like an open-circuit af-
te ter 60 ms when a surge occurs on the line. Mean-
le while, the CLP200M has to withstand the surge.
o The protection device CLP200M totally fulfills this
bs test.
- O Fig. 27 : Power contact test.
ct(s) I
u 600 or < 10
rod V(RMS)
Obsolete P 50Hz
PTC
15min
4Ω
Rsense
TIPL
TIPS
1/2 CLP200M
GND
I2
Rp
-48V
V
LCP1511D
SLIC
V2
12/21
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