DS2413 View Datasheet(PDF) - Maxim Integrated
Part Name
Description
MFG CO.
'DS2413' PDF : 18 Pages View PDF
DS2413: 1-Wire Dual Channel Addressable Switch
PARAMETER
Presence Detect Sample
Time (Notes 1, 20)
IO PIN, 1-Wire WRITE
Write-0 Low Time
(Notes 1, 17)
Write-1 Low Time
(Notes 1, 17)
IO PIN, 1-Wire READ
Read Low Time
(Notes 1, 18)
Read Sample Time
(Notes 1, 18)
PIO Pins
Leakage Current
Input Capacitance
Output low voltage
Input Low Voltage
Input High Voltage
(Note 21)
SYMBOL
tMSP
CONDITIONS
Standard speed, VPUP > 4.5V
Standard speed
Overdrive speed, VPUP ≥ 4.5V
Overdrive speed
Standard speed, VPUP > 4.5V
Standard speed (Note 14)
tW0L
Overdrive speed, VPUP ≥ 4.5V
(Note 14)
Overdrive speed (Note 14)
tW1L
Standard speed
Overdrive speed
Standard speed
tRL
Overdrive speed
tMSR
Standard speed
Overdrive speed
ILP
CP
VOLP
VILP
VIHP
Pin at 28V (Note 19)
(Note 5)
20mA load current
(Note 1)
(Note 1)
MIN
67.4
69.6
7.7
9.1
60
62
7
8
5
1
5
1
tRL + δ
tRL + δ
8.5
TYP
100
VPUP –
0.3V
MAX
75
75
10
10
120
120
16
16
15
2
15 - δ
2-δ
15
2
24
0.4
0.8
28
UNITS
µs
µs
µs
µs
µs
µA
pF
V
V
V
Note 1:
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
Note 9:
Note 10:
Note 11:
Note 12:
Note 13:
Note 14:
Note 15:
Note 16:
Note 17:
Note 18:
Note 19:
Note 20:
Note 21:
System requirement.
Full RPUP range guaranteed by design and simulation. not production tested. Production testing performed at a fixed RPUP value.
Maximum allowable pullup resistance is a function of the number of 1-Wire devices in the system and 1-Wire recovery times. The
specified value here applies to systems with only one device and with the minimum 1-Wire recovery times. For more heavily
loaded systems, an active pullup such as that found in the DS2482-x00, DS2480B, or DS2490 may be required.
The I-V characteristic is linear for voltages greater than 10V.
Capacitance on the data pin could be 800pF when VPUP is first applied. If a 2.2kΩ resistor is used to pull up the data line, 2.5µs
after VPUP has been applied the parasite capacitance will not affect normal communications.
Guaranteed by design and simulation. Not production tested.
The voltage on IO needs to be less than or equal to VILMAX whenever the master drives the line low.
VTL and VTH are functions of the internal supply voltage, which is a function of VPUP and the 1-Wire Recovery Times. The VTH and
VTL maximum specifications are valid at VPUPmax (5.25V). In any case, VTL < VTH < VPUP.
Voltage below which, during a falling edge on IO, a logic 0 is detected.
Voltage above which, during a rising edge on IO, a logic 1 is detected.
After VTH is crossed during a rising edge on IO, the voltage on IO has to drop by at least VHY to be detected as logic '0'.
The I-V characteristic is linear for voltages less than 1V.
Applies to a single DS2413 attached to a 1-Wire line.
The earliest recognition of a negative edge is possible at tREH after VTH has been previously reached.
Highlighted numbers are NOT in compliance with legacy 1-Wire product standards. See comparison table below.
tPDH is deemed to have ended when the voltage on IO drops below 80% of VPUP on the leading edge of the presence-detect low
pulse. tPDL is deemed to have begun when the voltage on IO drops below 20% of VPUP on the leading edge of the pulse.
Interval during the negative edge on IO at the beginning of a Presence Detect pulse between the time at which the voltage is
80% of VPUP and the time at which the voltage is 20% of VPUP.
ε in Figure 12 represents the time required for the pullup circuitry to pull the voltage on IO up from VIL to VTH. The actual maximum
duration for the master to pull the line low is tW1Lmax + tF - ε and tW0Lmax + tF - ε respectively.
δ in Figure 12 represents the time required for the pullup circuitry to pull the voltage on IO up from VIL to the input high threshold
of the bus master. The actual maximum duration for the master to pull the line low is tRLmax + tF.
The I-V characteristic is linear for voltages greater than 7V.
tMSP is a system required sample point and not directly production tested. Production testing is performed on related parameters
tPDH and tPDL. Parameter tFPD is guaranteed by design and simulation, not production tested.
Production tested for VIHP(min). VIHP(max) is guaranteed by design and simulation, not production tested.
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