EVAL-AD5161DBZ View Datasheet(PDF) - Analog Devices
Part Name
Description
MFG CO.
'EVAL-AD5161DBZ' PDF : 20 Pages View PDF
AD5161
Data Sheet
TEST CIRCUITS
Figure 28 to Figure 36 illustrate the test circuits that define the test conditions used in the product specification tables.
5V
DUT
A
V+
W
B
V+ = VDD
1LSB = V+/2N
VMS
OFFSET
GND
OP279
VIN
W
A DUT B
OFFSET
BIAS
VOUT
Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
NO CONNECT
DUT
A
W
B
IW
VMS
Figure 33. Test Circuit for Noninverting Gain
A
W
VIN
DUT
OFFSET
GND
B
2.5V
+15V
AD8610
–15V
VOUT
Figure 29. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
VMS2
DUT
A
W
B
IW = VDD / RNOMINAL
VW
VMS1 RW = [VMS1 – VMS2]/ IW
Figure 34. Test Circuit for Gain vs. Frequency
DUT
W
B
RSW =
0.1V
ISW
CODE = 0x00
ISW
0.1V
VSS TO VDD
Figure 30. Test Circuit for Wiper Resistance
VA
VDD A
V+
W
B
( ) V+= VDD 10%
PSRR (dB) = 20 LOG
∆V MS
∆V DD
PSS (%/%) = ∆VMS%
∆V DD%
VMS
Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
OFFSET
GND
A DUT B
VIN
W
OFFSET
BIAS
5V
OP279
VOUT
Figure 32. Test Circuit for Inverting Gain
Figure 35. Test Circuit for Incremental ON Resistance
NC
VDD DUT
A
W
ICM
VSS GND
B
VCM
NC NC = NO CONNECT
Figure 36. Test Circuit for Common-Mode Leakage Current
Rev. B | Page 12 of 20
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