EVAL-ADE7880EBZ View Datasheet(PDF) - Analog Devices
Part Name
Description
MFG CO.
'EVAL-ADE7880EBZ' PDF : 107 Pages View PDF
Data Sheet
ADE7880
TEST CIRCUIT
In Figure 32, the PM1 and PM0 pins are pulled up internally to VDD. Select the mode of operation by using a microcontroller to
programmatically change the pin values. See the Power Management section for details.
3.3V
10µF +
0.1µF
4.7µF +
0.22µF
4.7µF +
0.22µF
24 26 5
3.3V
10kΩ
1µF
1kΩ
2.2nF
2.2nF
1kΩ
SAME AS
IAP, IAN
SAME AS
IAP, IAN
1kΩ
2.2nF
1kΩ
2.2nF SAME AS
VCP
SAME AS
VCP
2 PM0
SS/HSA 39
3 PM1
4 RESET
MOSI/SDA 38
MISO/HSD 37
3.3V
7 IAP
SCLK/SCL 36
1.5kΩ
8 IAN
CF3/HSCLK 35
9 IBP
CF2 34
12 IBN
13 ICP
ADE7880
CF1 33
IRQ1 32
SAME AS
CF2
14 ICN
IRQ0 29
18 VN
19 VCP
REFIN/OUT 17
CLKOUT 28
CL2
4.7µF+
22 VBP
23 VAP
6 25
5MΩ
CLKIN 27
16.384MHz
CL1
0.1µF
Figure 32. Test Circuit
Rev. C | Page 19 of 107
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