ADG888
TEST CIRCUITS
IDS
V1
S
D
VS
RON = V1/IDS
Figure 16. On Resistance
ID (ON)
NC
S
D
A
VD
Figure 18. On Leakage
IS (OFF)
S
A
VS
ID (OFF)
D
A
VD
Figure 17. Off Leakage
VDD
0.1μF
VDD
VS
S1B
S1A
D1
IN
GND
VOUT
RL
CL
50Ω
35pF
VIN
VOUT
50%
90%
tON
Figure 19. Switching Times, tON, tOFF
50%
90%
tOFF
VDD
0.1μF
VDD
VS
S1B
S1A
D1
IN
GND
VOUT
RL
CL
50Ω
35pF
VIN 0V
50%
VOUT
80%
tBBM
Figure 20. Break-Before-Make Time Delay, tBBM
50%
80%
tBBM
VDD
VS
D1
IN
S1B
S1A
GND
NC
VOUT
1nF
SW ON
VIN
VOUT
ΔVOUT
SW OFF
QINJ = CL ⋅ ΔVOUT
Figure 21. Charge Injection
Rev. A | Page 9 of 16