EVAL-CED1Z3 View Datasheet(PDF) - Analog Devices
Part Name
Description
MFG CO.
'EVAL-CED1Z3' PDF : 28 Pages View PDF
ABSOLUTE MAXIMUM RATINGS
Table 4.
Parameter
Analog Inputs/Outputs
IN+, IN− to GND1
REF2 to GND
VCM, CAP2 to GND
CAP1, REFIN to GND
Supply Voltage
VDD1
VDD2, VIO
Digital Inputs to GND
Digital Outputs to GND
Input Current to Any Pin Except
Supplies3
Operating Temperature Range
(Commercial)
Storage Temperature Range
Junction Temperature
ESD
Rating
−0.3 V to REF + 0.3 V or
±130 mA
−0.3 V to +6 V
−0.3 V to +6 V
−0.3 V to +2.7 V
−0.3 V to +6 V
−0.3 V to +3 V
−0.3 V to VIO + 0.3 V
−0.3 V to VIO + 0.3 V
±10 mA
−40°C to +85°C
−65°C to +150°C
150°C
1 kV
1 See the Analog Inputs section.
2 Keep CNV± low for any external REF voltage > 4.3 V applied to the REF pin.
3 Transient currents of up to 100 mA do not cause SCR latch-up.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
AD7626
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Table 5. Thermal Resistance
Package Type
θJA
θJC
Unit
32-Lead LFCSP_VQ
40
4
°C/W
ESD CAUTION
Rev. A | Page 7 of
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