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HCPL-5500 View Datasheet(PDF) - Avago Technologies

Part Name
Description
MFG CO.
'HCPL-5500' PDF : 13 Pages View PDF
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IF
B
RM
A
D.U.T.
VCC
+5 V
RL
VO
V FF
GND
SINGLE CHANNEL OR
COMMON VCC DEVICES
V CM
+-
PULSE GEN.
NOTE: BASE LEAD NOT CONNECTED.
Figure 10. Test Circuit for Transient Immunity and Typical Waveforms.
5V
V CC
220 Ω
TTL
D.U.T.
RL
V CC
GND
EACH CHANNEL
LOGIC GATE
0.01 μF
Figure 11. Recommended Logic Interface.
VCC
(EACH INPUT)
+-
VIN
D.U.T.*
VCC
VO
GND
VOC
0.1 μF
(EACH OUTPUT)
NOMINAL CONDITIONS
PER CHANNEL: IF = 20 mA
IO = 4 mA
ICC = 30 μA
NOTE: BASE LEAD NOT CONNECTED.
T A = +125 ˚C
Figure 12. Operating Circuit for Burn-In and Steady State Life Tests. All
Channels Tested Simultaneously.
Logic Family
Device No.
VCC
RL 5% Toler-
ance
LSTTL
54LS14
5V
18 k*
CMOS
CD40106BM
5V
15 V
8.2 k
22 k
*The equivalent output load resistance is affected by the LSTTL input
current and is approximately 8.2 kΩ. This is a worst case design
which takes into account 25% degradation of CTR. See App. Note
1002 to assess actual degradation and lifetime.
12
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