HM5164165 Series, HM5165165 Series
DC Characteristics (HM5165165 Series)
HM5165165
-5
-6
Parameter
Symbol Min Max Min Max Unit Test conditions
Operating current*1, *2
Standby current
I CC1
โ
140 โ
120 mA tRC = min
I CC2
โ2
โ
2
mA TTL interface
RAS, UCAS, LCAS = VIH
Dout = High-Z
โ
0.5 โ
0.5 mA CMOS interface
RAS, UCAS,
LCAS V CC โ 0.2 V
Dout = High-Z
Standby current
(L-version)
I CC2
โ
150 โ
150 ยตA CMOS interface
RAS, UCAS,
LCAS V CC โ 0.2 V
Dout = High-Z
RAS-only refresh current*2
I CC3
Standby current*1
I CC5
โ
140 โ
120 mA tRC = min
โ5
โ
5
mA RAS = VIH
UCAS, LCAS = VIL
Dout = enable
CAS-before-RAS refresh
current
I CC6
โ
140 โ
120 mA tRC = min
EDO page mode current*1, *3 ICC7
โ
120 โ
110 mA RAS = VIL , CAS cycle,
tHPC = tHPC min
Battery backup current*4
I CC10
โ
500 โ
500 ยตA CMOS interface
(Standby with CBR refresh)
Dout = High-Z
(L-version)
CBR refresh: tRC = 31.3 ยตs
tRAS 0.3 ยตs
Self refresh mode current
(L-version)
I CC11
โ
400 โ
400 ยตA CMOS interface
RAS, UCAS, LCAS 0.2 V
Dout = High-Z
Input leakage current
Output leakage current
I LI
โ5 5
โ5 5
ยตA 0 V Vin VCC + 0.3 V
I LO
โ5 5
โ5 5
ยตA 0 V Vout V CC
Dout = disable
Output high voltage
VOH
2.4
VCC
2.4
VCC
V
High Iout = โ2 mA
Output low voltage
VOL
0
0.4 0
0.4 V Low Iout = 2 mA
Notes: 1. ICC depends on output load condition when the device is selected. ICC max is specified at the output
open condition.
2. Address can be changed once or less while RAS = VIL.
3. Measured with one sequential address change per EDO cycle, tHPC.
4. VIH V CC โ 0.2 V, 0 V VIL 0.2 V.
10