L3121B View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
'L3121B' PDF : 7 Pages View PDF
Fig. 1: Surge peak current versus overload
duration (typical values).
ITSM(A)
40
35
30
25
20
15
10
5
0
1E-2
t(s)
1E-1
1E+0
1E+1
F=50H z
Tj initial=25°C
1E+2
1E+3
L3121B
Fig. 2: Typical relative variation of holding current
versus ambient temperature.
IH [Tamb]
IH [Tamb = 25°C]
1.45
1.30
1.15
1.0
0.85
Tamb (°C)
0.70
-40 -20 0
20 40 60 80 85
Fig. 3: Typical relative variation of breakdown
voltage versus ambient temperature.
VBR [Tamb]
VBR [Tamb = 25°C]
2.04
2.00
IR = 1 mA
1.06
1.02
0.98
0.94
0.90
-40 -20 0
Tamb (°C)
20 40 60 80 85
Fig. 4: Junction capacitance versus reverse
applied voltage.
Fig. 5: Typical relative variation of leakage current
versus ambient temperature.
Fig. 6: Typical relative variation of peak pulse
current (10/1000µs) versus ambient temperature.
IR[Tj] / IR [Tj=25°C]
1E+5
1E+4
1E+3
1E+2
1E+1
1E+0
25
Tj(°C)
50
75
100
Ipp[Tamb] / Ipp [25°C]
1.10
1.05
1.00
0.95
Tamb(°C)
125
0.90
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80
5/7
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