L3234 View Datasheet(PDF) - STMicroelectronics

Part Name

Description

MFG CO.

L3234

HIGHLY INTEGRATED SLIC KIT TARGETED TO PABX AND KEY SYSTEM APPLICATIONS

STMicroelectronics 

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Figure 4: Dynamic Features of L3234

L3234 - L3235

DATA TRANSMISSION INTERFERENCE TEST

The L3234 meet the requirements of the technical

specification ST/PAA/TPA/STP/1063 from the

CNET. The test circuit used is indicated below.

The measured error rate for data transmission is

lower than 10-6 during the ringing phase.

This test measures if during the ringing phase the

circuit induce any noise to the closer lines.

Figure 5: Test Circuit Data Transmission Interference Test

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