LCP150S View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
'LCP150S' PDF : 6 Pages View PDF
LCP150S
Fig. 1 : Surge peak current versus overload
duration (typical values).
ITSM(A)
30
25
20
15
10
5
0
1E-2
1E-1
Tj initial = 25°C
t(s)
1E+0
1E+1
1E+2
1E+3
FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT = GO - NOGO TEST.
R
Vbat = - 48V
VSGL
- Vpp
Ipp = 10A,10/1000 s
This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional
test circuit.
This test can be performedif the reference test circuit can’t be implemented.
TEST PROCEDURE :
1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs.
3) The D.U.T will come back to the OFF-State within a duration of 50 ms max.
The VSGL is measured just before firing
4/6
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