LH28F320S5HNS-L100 View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
'LH28F320S5HNS-L100' PDF : 61 Pages View PDF
sharp
LHF32K10
37
6.2.4 AC CHARACTERISTICS - READ-ONLY OPERATIONS(1)
Versions(4)
VCC=5V±0.5V, 5V±0.25V, TA=0°C to +70°C
VCC=5V±0.25V LH28F320S5-L90(5)
VCC=5V±0.5V
LH28F320S5-
L100(6)
Sym.
Parameter
Notes Min.
Max.
Min.
Max.
Unit
tAVAV Read Cycle Time
tAVQV Address to Output Delay
tELQV CE# to Output Delay
2
tPHQV RP# High to Output Delay
tGLQV OE# to Output Delay
2
tELQX CE# to Output in Low Z
3
tEHQZ CE# High to Output in High Z
3
tGLQX OE# to Output in Low Z
3
tGHQZ OE# High to Output in High Z
3
tOH
Output Hold from Address, CE# or
OE# Change, Whichever Occurs First
3
90
100
ns
90
100
ns
90
100
ns
400
400
ns
30
35
ns
0
0
ns
25
30
ns
0
0
ns
10
10
ns
0
0
ns
tFLQV
tFHQV
BYTE# to Output Delay
3
tFLQZ BYTE# to Output in High Z
3
tELFL
tELFH
CE# Low to BYTE# High or Low
3
NOTES:
90
100
ns
25
30
ns
5
5
ns
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling edge of CE# without impact on tELQV.
3. Sampled, not 100% tested.
4. See Ordering Information for device speeds (valid operational combinations).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard
Configuration) for testing characteristics.
Rev. 1.55
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