LT1460S3 (SOT-23)
APPLICATIONS INFORMATION
VGEN
2.5V
1.5V
VOUT
1mA
VOUT
10mA
1µs/DIV
Figure 2. CL = 0µF
1460S3 F02
VGEN
2.5V
1.5V
VOUT
1mA
VOUT
10mA
100µs/DIV
Figure 3. CL = 0.1µF
1460S3-5 F03
VGEN
2.5V
1.5V
VOUT
1µF
VOUT
4.7µF
100µs/DIV
Figure 4. IOUT = 1mA
1460S3 F04
Table 1 gives the maximum output capacitance for various
load currents and output voltages to avoid instability. Load
capacitors with low ESR (effective series resistance) cause
more ringing than capacitors with higher ESR such as
polarized aluminum or tantalum capacitors.
Table 1. Maximum Output Capacitance
VOLTAGE
OPTION IOUT = 100µA
2.5V
> 10µF
IOUT = 1mA
> 10µF
IOUT = 10mA IOUT = 20mA
2µF
0.68µF
3V
> 10µF
> 10µF
2µF
0.68µF
3.3V
> 10µF
> 10µF
1µF
0.68µF
5V
> 10µF
> 10µF
1µF
0.68µF
10V
> 10µF
1µF
0.15µF
0.1µF
Long-Term Drift
Long-term drift cannot be extrapolated from acceler-
ated high temperature testing. This erroneous tech-
nique gives drift numbers that are widely optimistic. The
only way long-term drift can be determined is to mea-
sure it over the time interval of interest. The LT1460S3
long-term drift data was taken on over 100 parts that were
soldered into PC boards similar to a “real world” applica-
tion. The boards were then placed into a constant tempera-
ture oven with TA = 30°C, their outputs were scanned
regularly and measured with an 8.5 digit DVM. Figure 5
shows typical long-term drift of the LT1460S3s.
150
100
50
0
– 50
–100
–150
0 100 200 300 400 500 600 700 800 900 1000
HOURS
1460S3 F05
Figure 5. Typical Long-Term Drift
8