LT1ZS95A View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
'LT1ZS95A' PDF : 16 Pages View PDF
5. Reliability
The reliability of products shall be satisfied with items listed below.
5-1. Test items and test conditions(in accordance with JIS 7021)
Test items
Test conditions
temperature cycling -55”c(30min)--+110”c(30min),100cy
High temp. and high
humidity storage
High temperature
storage
Ta=+85”C, 85%RH, t=lOOOh
Ta=(Tstg-maximum ratings),tzlOOOh
Low temperature storage Ta=(Tstg_minimun ratings),t=lOOOh
Operating test Ta=25cC,Ir=(Ir~maximum ratings),t=lOOOh
Mechanical shock
Variable frequency
vibration
Solderingheat
15 OOOm/s’, 0.5ms,
3times I *X,+Y,*Z direction
200mis2,100-2OOO-IOOHu’sweepfo2rOmin.,
4timeslX,Y,Z direction
Referto the attachedsheet,
Page141151time
Confidence level: 90s
Samples (n) LTPD
Defective (C) (%)
n=22, C=O
10
n=22, C=O
10
n=22, C=O
10
n=22, C=O
10
n=22, C=O
li,
n=ll, C=O 20
n=ll, C=O 20
n=l 1, C=O 20
5-2. Failurejudgementcriteria (Notel)
Parameter
Symbol
Failurejudgementcriteria (Note2)
Forward voltage
VF
v, > U.S.L. x 1.2
Reversecurrent
IR
IR > U.S.L. x 2.0
Luminousintensity
Iv
Iv > The first stagevalueX 2.0 or The first stagevalueX 0.5 > Iv
(Note1)Measuringconditionis in accordancewith specification.
(Note2)U.S.L. is shownby UpperSpecificationLimit.
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