LTM2882-5 View Datasheet(PDF) - Linear Technology
Part Name
Description
MFG CO.
'LTM2882-5' PDF : 22 Pages View PDF
LTM2882
applications information
Channel Timing Uncertainty
Multiple channels are supported across the isolation bound-
ary by encoding and decoding of the inputs and outputs.
The technique used assigns T1IN/R1IN the highest priority
such that there is no jitter on the associated output chan-
nels T1OUT/R1OUT, only delay. This preemptive scheme
will produce a certain amount of uncertainty on T2IN/
R2IN to T2OUT/R2OUT and DIN to DOUT. The resulting
pulse width uncertainty on these low priority channels is
typically ±6ns, but may vary up to about 40ns.
Half-Duplex Operation
The DE pin serves as a low-latency driver enable for half-
duplex operation. The DE pin can be easily driven from
the logic side by using the uncommitted auxiliary digital
channel, DIN to DOUT. Each driver is enabled and disabled
in less than 2µs, while each receiver remains continuously
active. This mode of operation is illustrated in Figure 6.
3.3V (LTM2882-3)
5V (LTM2882-5)
RX TX
VL VCC
ON
DIN
T1IN
R1OUT
T2IN
R2OUT
GND
LTM2882
VCC2
DE
DOUT
T1OUT
R1IN
T2OUT
R2IN
GND2
2882 F06
Figure 6. Half-Duplex Configuration Using DOUT to Drive DE
Driver Overvoltage and Overcurrent Protection
The driver outputs are protected from short-circuits to
any voltage within the absolute maximum range of ±15V
relative to GND2. The maximum current is limited to no
more than 70mA to maintain a safe power dissipation and
prevent damaging the LTM2882.
Receiver Overvoltage and Open Circuit
The receiver inputs are protected from common mode
voltages of ±25V relative to GND2.
Each receiver input has a nominal input impedance of 5kΩ
relative to GND2. An open circuit condition will generate a
logic high on each receiver’s respective output pin.
RF, Magnetic Field Immunity
The LTM2882 has been independently evaluated and has
successfully passed the RF and magnetic field immunity
testing requirements per European Standard EN 55024,
in accordance with the following test standards:
EN 61000-4-3
Radiated, Radio-Frequency,
Electromagnetic Field Immunity
EN 61000-4-8
Power Frequency
Magnetic Field Immunity
EN 61000-4-9 Pulsed Magnetic Field Immunity
Tests were performed using an unshielded test card de-
signed per the data sheet PCB layout recommendations.
Specific limits per test are detailed in Table 1.
Table 1
TEST
EN 61000-4-3, Annex D
EN 61000-4-8, Level 4
EN 61000-4-8, Level 5
EN 61000-4-9, Level 5
*Non IEC Method
FREQUENCY
80MHz to 1GHz
1.4MHz to 2GHz
2GHz to 2.7GHz
50Hz and 60Hz
60Hz
Pulse
FIELD STRENGTH
10V/m
3V/m
1V/m
30A/m
100A/m*
1000A/m
For more information www.linear.com/LTM2882
2882ff
13
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