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M215HW01-V7 View Datasheet(PDF) - AU Optronics

Part Name
Description
MFG CO.
M215HW01-V7
Auo
AU Optronics  Auo
'M215HW01-V7' PDF : 27 Pages View PDF
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Product Specification
AU OPTRONICS CORPORATION
M215HW01 V7
8.0 Reliability Test
Environment test conditions are listed as following table.
Items
Required Condition
Temperature Humidity Bias (THB) Ta= 50, 80%RH, 300hours
Note
High Temperature Operation (HTO) Ta= 50, 50%RH, 300hours
Low Temperature Operation (LTO)
High Temperature Storage (HTS)
Low Temperature Storage (LTS)
Vibration Test
(Non-operation)
Ta= 0, 300hours
Ta= 60, 300hours
Ta= -20, 300hours
Acceleration: 1.5 Grms
Wave: Random
Frequency: 10 - 200 Hz
Sweep: 30 Minutes each Axis (X, Y, Z)
Shock Test
(Non-operation)
Acceleration: 50 G
Wave: Half-sine
Active Time: 20 ms
Direction: ±X, ±Y, ±Z (one time for each Axis)
Drop Test
Height: 60 cm, package test
Thermal Shock Test (TST)
-20/30min, 60/30min, 100 cycles
1
On/Off Test
On/10sec, Off/10sec, 30,000 cycles
Contact Discharge: ± 8KV, 150pF(330) 1sec,
8 points, 25 times/ point.
ESD (Electro Static Discharge)
2
Air Discharge: ± 15KV, 150pF(330) 1sec
8 points, 25 times/ point.
Altitude Test
Operation:10,000 ft
Non-Operation:30,000 ft
Note 1: The TFT-LCD module will not sustain damage after being subjected to 100 cycles of rapid
temperature change. A cycle of rapid temperature change consists of varying the temperature from
-20℃ to 60℃, and back again. Power is not applied during the test. After temperature cycling, the
unit is placed in normal room ambient for at least 4 hours before power on.
Note 2: EN61000-4-2, ESD class B: Certain performance degradation allowed
No data lost
Self-recoverable
No hardware failures.
document version 0.1
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