M25P16-VMF3TP View Datasheet(PDF) - Micron Technology
Part Name
Description
MFG CO.
'M25P16-VMF3TP' PDF : 62 Pages View PDF
Micron M25P16 Serial Flash Embedded Memory
Maximum Ratings and Operating Conditions
Maximum Ratings and Operating Conditions
Caution: Stressing the device beyond the absolute maximum ratings may cause perma-
nent damage to the device. These are stress ratings only and operation of the device be-
yond any specification or condition in the operating sections of this data sheet is not
recommended. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability.
Table 14: Absolute Maximum Ratings
Symbol
TSTG
TLEAD
VIO
VCC
VPP
VESD
Parameter
Storage temperature
Lead temperature during soldering
Input and output voltage (with respect to ground)
Supply voltage
FAST PROGRAM / ERASE voltage
Electrostatic discharge voltage (Human Body mod-
el)
Min
–65
–
–0.6
–0.6
–0.2
–2000
Max
150
See note
VCC+0.6
4.0
10.0
2000
Units
°C
°C
V
V
V
V
Notes
1
2
3
Notes:
1. The TLEAD signal is compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb as-
sembly), the Micron RoHS-compliant 7191395 specification, and the European directive
on Restrictions on Hazardous Substances (RoHS) 2002/95/EU.
2. The minimum voltage may reach the value of –2V for no more than 20ns during transi-
tions; the maximum may reach the value of VCC +2V for no more than 20ns during tran-
sitions.
3. The VESD signal: JEDEC Std JESD22-A114A (C1 = 100 pF, R1 = 1500Ω, R2 = 500Ω).
Table 15: Operating Conditions
Symbol
VCC
VPPH
TA
TA
TAVPP
Parameter
Supply voltage
Supply voltage on W#/VPP pin for FAST PRO-
GRAM / ERASE
Ambient operating temperature (grade 6)
Ambient operating temperature (grade 3)
Ambient operating temperature for FAST
PROGRAM / ERASE
Min
2.7
8.5
–40
–40
15
Typical
–
–
–
–
25
Max
3.6
9.5
85
125
35
Unit
V
V
Notes
°C 1
°C 2
°C
Notes: 1. Autograde 6 and standard parts (grade 6) are tested to 85 °C. Autograde 6 follows the
high reliability certified test flow.
2. Autograde 3 is tested to 125 °C.
Table 16: Data Retention and Endurance
Symbol
Condition
Program/Erase Grade 6, grade 3, autograde 6
Cycles
Data Retention at 55°C
Min
100,000
20
Max
–
–
Unit
Cycles per block
Years
PDF: 09005aef8456656c
m25p16.pdf - Rev. J 1/18 EN
41
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© 2011 Micron Technology, Inc. All rights reserved.
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