DC and AC parameters
M25PE40
Table 23. Reset conditions
Test conditions specified in Table 14 and Table 15
Symbol Alt.
Parameter
Conditions
Min. Typ. Max. Unit
tRLRH(1) tRST Reset pulse width
10
µs
tSHRH
Chip Select High to
Reset High
Chip should have been
deselected before Reset is
de-asserted
10
ns
1. Value guaranteed by characterization, not 100% tested in production.
Table 24. Timings after a Reset Low pulse(1)(2)
Test conditions specified in Table 14 and Table 15
Symbol Alt. Parameter
Conditions: Reset pulse occurred
Max.
While decoding an instruction(3): WREN,
WRDI, RDID, RDSR, READ, RDLR,
Fast_Read, WRLR, PW, PP, PE, SE, BE,
30
SSE, DP, RDP
Under completion of an Erase or Program
cycle of a PW, PP, PE, SE, BE operation
300
tRHSL
tREC
Reset
recovery time
Under completion of an Erase cycle of an
SSE operation
3
Under completion of a WRSR operation
tW (see
Table 21)
Device deselected (S High) and in Standby
mode
0
1. All the values are guaranteed by characterization, and not 100% tested in production.
2. See Table 12 for a description of the device status after a Reset Low pulse.
3. S remains Low while Reset is Low.
Figure 29. Reset AC waveforms
Unit
µs
µs
ms
ms
µs
S
Reset
tSHRH
tRLRH
tRHSL
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