M29W800DT, M29W800DB
Figure 10. AC measurement load circuit
VCC
DEVICE
UNDER
TEST
0.1µF
DC and AC parameters
VCC
25kΩ
25kΩ
CL
CL includes JIG capacitance
AI04499
Table 10. Device capacitance(1)
Symbol
Parameter
Test condition
Min
Max
Unit
CIN
Input capacitance
COUT
Output capacitance
1. Sampled only, not 100% tested.
VIN = 0 V
VOUT = 0 V
6
pF
12
pF
Table 11. DC characteristics
Symbol
Parameter
Test condition
Min
Max Unit
ILI
Input leakage current
ILO Output leakage current
ICC1 Supply current (read)
ICC2 Supply current (standby)
ICC3 (1) Supply current (program/erase)
VIL
VIH
VOL
VOH
VID
IID
VLKO
Input low voltage
Input high voltage
Output low voltage
Output high voltage
Identification voltage
Identification current
Program/erase lockout supply
voltage
0 V ≤ VIN ≤ VCC
0 V ≤ VOUT ≤ VCC
E = VIL, G = VIH,
f = 6 MHz
E = VCC ± 0.2 V,
RP = VCC ± 0.2 V
Program/erase
controller active
IOL = 1.8 mA
IOH = –100 µA
A9 = VID
±1
µA
±1
µA
10
mA
100
µA
20
mA
–0.5
0.8
V
0.7VCC VCC + 0.3 V
0.45
V
VCC – 0.4
V
11.5
12.5
V
100
µA
1.8
2.3
V
1. Sampled only, not 100% tested.
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