M29W800T View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
M29W800T
STMicroelectronics
'M29W800T' PDF : 33 Pages View PDF
Table 11. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
≤ 10ns
0 to 3V
Input and Output Timing Ref. Voltages
1.5V
Figure 4. AC Testing Input Output Waveform
3V
1.5V
0V
AI01417
M29W800T, M29W800B
Figure 5. AC Testing Load Circuit
0.8V
1N914
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 30pF or 100pF
CL includes JIG capacitance
AI01968
Table 12. Capacitance(1) (TA = 25 °C, f = 1 MHz )
Symbol
Parameter
Test Condition
CIN
Input Capacitance
C OUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 13. DC Characteristics
(TA = 0 to 70°C, –20 to 85°C or –40 to 85°C; VCC = 2.7V to 3.6V)
Symbol
Parameter
Test Condition
Min
Max
Unit
ILI
ILO
ICC1
ICC1
ICC3
ICC4 (1)
Input Leakage Current
Output Leakage Current
Supply Current (Read) Byte
Supply Current (Read) Word
Supply Current (Standby)
Supply Current (Program or Erase)
0V ≤ VIN ≤ VCC
0V ≤ VOUT ≤ VCC
E = VIL, G = VIH, f = 6MHz
E = VIL, G = VIH, f = 6MHz
E = VCC ± 0.2V
Byte program, Block or
Chip Erase in progress
±1
µA
±1
µA
10
mA
10
mA
100
µA
20
mA
VIL
Input Low Voltage
VIH
Input High Voltage
VOL Output Low Voltage
VOH Output High Voltage CMOS
VID
A9 Voltage (Electronic Signature)
IID
A9 Current (Electronic Signature)
VLKO
Supply Voltage (Erase and
Program lock-out)
Note: 1. Sampled only, not 100% tested.
IOL = 1.8mA
IOH = –100µA
A9 = VID
–0.5
0.8
V
0.7 VCC
VCC + 0.3
V
0.45
V
VCC –0.4V
V
11.5
12.5
V
100
µA
2.0
2.3
V
15/33
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