M35080
Table 9. DC Characteristics
(TA = 0 to 70°C, –40 to 85°C or –40 to 125°C; VCC = 4.5V to 5.5V)
Symbol
Parameter
Test Condition
ILI
Input Leakage Current
ILO
Output Leakage Current
ICC
Supply Current
C = 0.1 VCC/0.9 VCC, @ 5 MHz,
VCC = 5V, Q = Open
C = 0.1 VCC/0.9 VCC, @ 2 MHz,
VCC = 5V, Q = Open, Note 2
ICC1
Standby Current
S = VCC, VIN = VSS or VCC, VCC = 5V
S = VCC, VIN = VSS or VCC, VCC = 5V,
Note 2
VIL
Input Low Voltage
VIH
Input High Voltage
VOL 1
Output Low Voltage
IOL = 2mA, VCC = 5V
IOL = 2mA, VCC = 5V, Note 2
VOH 1
Output High Voltage
IOH = –2mA, VCC = 5V
IOH = –2mA, VCC = 5V, Note 2
Note: 1. The device meets output requirements for both TTL and CMOS standards.
2. Test performed at –40 to 125°C temperature range, Grade 3.
Min
Max
Unit
±2
µA
±2
µA
3
mA
3
mA
10
µA
20
µA
–0.3
0.3 VCC
V
0.7 VCC VCC + 1
V
0.4
V
0.4
V
0.8 VCC
V
0.8 VCC
V
Table 10. Input Parameters 1
(TA = 25 C, f = 5 MHz)
Symbol
Parameter
CIN
Input Capacitance (D)
CIN
Input Capacitance (other pins)
tLPF
Input Signal Pulse Width Filtered Out
Note: 1. Sampled only, not 100% tested.
Min
Max
Unit
8
pF
6
pF
10
ns
Table 11. AC Measurement Conditions
Input Rise and Fall Times
≤ 50ns
Input Pulse Voltages
0.2VCC to 0.8VCC
Input and Output Timing
Reference Voltages
0.3VCC to 0.7VCC
Output Load
CL = 100pF
Note: 1. Output Hi-Z is defined as the point where data is no long-
er driven.
Figure 13. AC Testing Input Output
0.8VCC
0.2VCC
0.7VCC
0.3VCC
AI00825
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