MC33661PEF View Datasheet(PDF) - Freescale Semiconductor

Part Name

Description

MFG CO.

MC33661PEF

Local Interconnect Network (LIN) Enhanced Physical Interface with Selectable Slew Rate

Freescale Semiconductor 

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FUNCTIONAL DEVICE OPERATION

OPERATIONAL MODES

ELECTROMAGNETIC COMPATIBILITY

RADIATED EMISSION IN NORMAL AND SLOW

MODES

The 33661 has been tested for radiated emission

performances. Figures 16 and 17 show the results in the

frequency range 100 kHz to 2.0 MHz. Test conditions are in

accordance with CISPR25 recommendations, bus length of

1.5 meters, device loaded with 10 nF and 500  bus

impedance.

Figure 16 displays the results when the device is set in the

Normal mode, optimized for baud rate up to 20 kbps.

Figure 17 displays the results when the device is set in the

Slow mode, optimized for baud rate up to 10 kbps. The level

of emissions is significantly reduced compared to the already

excellent level of the Normal mode.

Figure 16. Radiated Emission in Normal Mode

33661

16

Figure 17. Radiated Emission in Slow Mode

Analog Integrated Circuit Device Data

Freescale Semiconductor

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