MC9S12DG256 View Datasheet(PDF) - Freescale Semiconductor
Part Name
Description
MFG CO.
'MC9S12DG256' PDF : 132 Pages View PDF
MC9S12DT256 Device User Guide V03.07
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed
Table A-12 NVM Reliability Characteristics1
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol Min
Typ
Max Unit
Flash Reliability Characteristics
Data retention after 10,000 program/erase cycles at
1 C an average junction temperature of TJavg ≤ 85°C
15
tFLRET
Data retention with <100 program/erase cycles at an
2 C average junction temperature TJavg ≤ 85°C
20
1002
1002
—
Years
—
Number of program/erase cycles
3 C (–40°C ≤ TJ ≤ 0°C)
Number of program/erase cycles
4 C (0°C ≤ TJ ≤ 140°C)
10,000
—
—
nFL
Cycles
10,000
100,0003
—
EEPROM Reliability Characteristics
Data retention after up to 100,000 program/erase
5 C cycles at an average junction temperature of
TJavg ≤ 85°C
15
tEEPRET
Data retention with <100 program/erase cycles at an
6 C average junction temperature TJavg ≤ 85°C
20
1002
1002
—
Years
—
Number of program/erase cycles
7 C (–40°C ≤ TJ ≤ 0°C)
Number of program/erase cycles
8 C (0°C < TJ ≤ 140°C)
nEEP
10,000
—
100,000 300,0003
—
Cycles
—
NOTES:
1. TJavg will not exeed 85°C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
application.
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618.
3. Spec table quotes typical endurance evaluated at 25°C for this product family, typical endurance at various temperature can
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer
to Engineering Bulletin EB619.
106
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