MG65PB38 View Datasheet(PDF) - Oki Electric Industry
Part Name
Description
MFG CO.
'MG65PB38' PDF : 22 Pages View PDF
โโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโโ s MG63P/64P/65P s
More information on OKIโs floorplanning capabilities is available in Okiโs Application Note, Using Okiโs
Floorplanner: Standalone Operation and Links to Synopsys.
Initial Synthesis
Constraints
Gate Level
Netlist
(EDIF)
HDL Entry
Synthesis
No
Constraints Met?
Yes
Initial Floorplan
Incremental
Optimization with
Physical Information
No
Constraints Met?
Yes
Invoke Import on
Floorplanner
Incremental
Floorplan
PDEF
(Synopsis)
Gate Level
Netlist
(EDIF)
DSPF/Oki RC/
PDEF (Synopsys)
Wire Load Model (Synopsys)
Net Capacitance (Synopsys
Script (Synopsys)
Delay
(SDF)
= In Synopsys DC/DA
= In Floorplanner
Invoke Export on
Floorplanner
Invoke Delay
Load
Back-Annotation Files
No
Constraints Met?
Yes
To Simulation and P&R
Timing Optimization
Figure 15. LSF System Design Flow
IEEE JTAG Boundary Scan Support
Boundary scan offers efficient board-level and chip-level testing capabilities. Benefits resulting from
incorporating boundary-scan logic into a design include:
โข Improved chip-level and board-level testing and failure diagnostic capabilities
โข Support for testing of components with limited probe access
โข Easy-to-maintain testability and system self-test capability with on-board software
โข Capability to fully isolate and test components on the scan path
โข Built-in test logic that can be activated and monitored
โข An optional Boundary Scan Identification (ID) Register
Oki Semiconductor
15
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