MX29F016
CAPACITANCE (TA = 25oC, f = 1.0 MHz)
SYMBOL
CIN
COUT
PARAMETER
Input Capacitance
Output Capacitance
MIN.
TYP
MAX.
8
12
UNIT
pF
pF
CONDITIONS
VIN = 0V
VOUT = 0V
READ OPERATION
DC CHARACTERISTICS (TA = -40°C TO 85°C, VCC = 5V±10%)
SYMBOL PARAMETER
MIN.
TYP
MAX.
UNIT
CONDITIONS
ILI
Input Leakage Current
1
uA
VIN = GND to VCC
ILO
Output Leakage Current
±1
uA
VOUT = GND to VCC
ISB1
Standby VCC current
1
mA
CE = VIH
ISB2
0.2
5
uA
CE = VCC + 0.3V
ICC1
Operating VCC current
30
mA
IOUT = 0mA, f=1MHz
ICC2
50
mA
IOUT = 0mA, f=10MHz
VIL
Input Low Voltage
-0.3(NOTE 1)
0.8
V
VIH
Input High Voltage
2.0
VCC + 0.3 V
VOL
Output Low Voltage
0.45
V
IOL = 2.1mA
VOH
Output High Voltage
2.4
V
IOH = -2mA
NOTES:
1. VIL min. = -1.0V for pulse width is equal to or less than 50 ns.
VIL min. = -2.0V for pulse width is equal to or less than 20 ns.
2. VIH max. = VCC + 1.5V for pulse width is equal to or less
than 20 ns
If VIH is over the specified maximum value, read operation
cannot be guaranteed.
AC CHARACTERISTICS (TA = -40oC to 85oC, VCC = 5V±10%)
Read Operations
SYMBOL
tACC
tCE
tOE
tDF
tOH
PARAMETER
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float (Note1)
Address to Output hold
29F016-90 29F016-12
MIN. MAX. MIN. MAX.
90
120
90
120
40
50
0
30 0 30
0
0
UNIT
ns
ns
ns
ns
ns
CONDITIONS
CE=OE=VIL
OE=VIL
CE=VIL
CE=VIL
CE=OE=VIL
TEST CONDITIONS:
• Input pulse levels: 0.45V/2.4V*
• Input rise and fall times is equal to or less than 20ns
• Output load: 1 TTL gate + 100pF *(Including scope and jig)
• Reference levels for measuring timing*: 0.8V, 2.0V
NOTE:
1. tDF is defined as the time at which the output achieves the
open circuit condition and data is no longer driven.
P/N:PM0590
REV. 1.4, NOV. 21, 2002
14