MX29F022TQC-70 View Datasheet(PDF) - Macronix International

Part Name

Description

MFG CO.

MX29F022TQC-70

2M-BIT[256K x 8]CMOS FLASH MEMORY

Macronix International 

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MX29F022/022NT/B

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

1.6K ohm

+5V

CL

1.2K ohm

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance for 29F022/022N-70,

29F022/022N-90,29F022/022N-12

CL=50pF Including jig capacitance for 29F022/022N-55

SWITCHING TEST WAVEFORMS(I) for MX29F022/022N-70/90/120

2.4V

0.45V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are <20ns.

SWITCHING TEST WAVEFORMS(I) for MX29F022/022N-55

P/N:PM0556

3.0V

0V

1.5V

INPUT

TEST POINTS

1.5V

OUTPUT

AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".

Input pulse rise and fall times are < 5ns.

REV. 1.3, NOV. 11, 2002

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