MX29LV040C
Table 12. ERASE AND PROGRAMMING PERFORMANCE (1)
PARAMETER
MIN.
LIMITS
TYP.(2)
Sector Erase Time
0.7
Chip Erase Time
4
Byte Programming Time
9
Chip Programming Time
4.5
Erase/Program Cycles
100,000
Note: 1.Not 100% Tested, Excludes external system level over head.
2.Typical values measured at 25° C, 3V.
3.Maximum values measured at 25° C, 2.7V.
MAX.(3)
15
32
300
13.5
UNITS
sec
sec
us
sec
Cycles
Table 13. LATCH-UP CHARACTERISTICS
Input Voltage with respect to GND on all pins except I/O pins
Input Voltage with respect to GND on all I/O pins
Current
Includes all pins except Vcc. Test conditions: Vcc = 3.0V, one pin at a time.
MIN.
-1.0V
-1.0V
-100mA
MAX.
12.5V
Vcc + 1.0V
+100mA
Table 14. DATA RETENTION
Parameter Description
Data Retention Time
Test Conditions
Min
150°C
10
125°C
20
Unit
Years
Years
P/N:PM1149
REV. 1.1, AUG. 30, 2005
44