P3C1256 View Datasheet(PDF) - Performance Semiconductor
Part Name
Description
MFG CO.
'P3C1256' PDF : 8 Pages View PDF
P3C1256
DATA RETENTION
Symbol
Parameter
Test Conditions
Min Max Unit
V
DR
I (1)
CCDR
VCC for Data Retention
Data Retention Current
CE
≥
V
CC
-0.2V,
CE
2
≤
0.2V
VIN ≥ VCC -0.2V or VIN ≤ 0.2V
VDR = 2.0V
2.0
3.6
V
600 µA
tCDR
Chip Deselect to Data
See Retention Waveform
Retention Time
0
ns
tR
Operating Recovery Time
t (2)
RC
ns
1.
CE
1
≥
VDR
-0.2V,
CE2
≥
VDR
-0.2V
or
CE2
≤
0.2V;
or
CE
1
≤
0.2V,
CE2
≤
0.2V;
VIN
≥
VDR
-0.2V
or
VIN
≤
0.2V
2. tRC = Read Cycle Time
LOW VCC DATA RETENTION WAVEFORM (1) (CE1 CONTROLLED)
VCC
CE
4.5V
tCDR
2.2V
Data Retention Mode
VDR
CE ≥ VDR -0.2V
4.5V
tR
2.2V
LOW V DATA RETENTION WAVEFORM (2) (CE CONTROLLED)
CC
2
VCC
CE2
4.5V
tCDR
VIL
2.2V
Data Retention Mode
VDR
CE2 ≤ 0.2V
4.5V
tR
VIL
139
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