P4C1256L-55DCLF View Datasheet(PDF) - Performance Semiconductor
Part Name
Description
MFG CO.
'P4C1256L-55DCLF' PDF : 11 Pages View PDF
DATA RETENTION CHARACTERISTICS
Symbol
Parameter
Test Conditons
VDR
VCC for Data Retention
ICCDR Data Retention Current
t
Chip Deselect to
CDR
Data Retention Time
tR†
Operation Recovery Time
*TA = +25°C
§tRC = Read Cycle Time
† This parameter is guaranteed but not tested.
CE ≥ VCC –0.2V,
VIN ≥ VCC –0.2V
or
V
IN
≤
0.2V
DATA RETENTION WAVEFORM
P4C1256L
Typ.*
Max
Min
VCC =
VCC =
Unit
2.0V 3.0V 2.0V 3.0V
2.0
V
10
15 600 900 µA
0
ns
tRC§
ns
Document # SRAM121 REV E
Page 7 of 11
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