P4C169 View Datasheet(PDF) - Semiconductor Corporation
Part Name
Description
MFG CO.
'P4C169' PDF : 15 Pages View PDF
AC TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Level
Output Timing Reference Level
Output Load
GND to 3.0V
3ns
1.5V
1.5V
See Figures 1 and 2
P4C168, P4C169, P4C170
Figure 1. Output Load
* including scope and test fixture.
Note:
Because of the ultra-high speed of the P4C168, P4C169 AND P4C170
care must be taken when testing these devices; an inadequate setup
can cause a normal functioning part to be rejected as faulty. Long high-
inductance leads that cause supply bounce must be avoided by bringing
the VCC and ground planes directly up to the contactor fingers. A high
frequency capacitor of 0.01 µF is also required between VCC and ground.
Figure 2. Thevenin Equivalent
To avoid signal reflections, proper termination must be used; for
example, a 50Ω test environment should be terminated into a 50Ω load
with 1.73V (Thevenin Voltage) at the comparator input, and a 116Ω
resistor must be used in series with DOUT to match 166Ω (Thevenin
Resistance).
LCC PIN CONFIGURATION
Document # SRAM107 REV A
LCC (L9)
Page 7 of 15
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