PCF2127 View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
MFG CO.
'PCF2127' PDF : 101 Pages View PDF
NXP Semiconductors
PCF2127
Accurate RTC with integrated quartz crystal for industrial applications
14. Dynamic characteristics
14.1 SPI-bus timing characteristics
Table 92. SPI-bus characteristics
VDD = 1.8 V to 4.2 V; VSS = 0 V; Tamb = 40 C to +85 C, unless otherwise specified. All timing values are valid within the
operating supply voltage at ambient temperature and referenced to VIL and VIH with an input voltage swing of VSS to VDD (see
Figure 55).
Symbol Parameter
Conditions
VDD = 1.8 V
Min Max
VDD = 4.2 V
Min Max
Unit
Pin SCL
fclk(SCL)
SCL clock frequency register read/write access
RAM write access
-
2.0
-
6.5
MHz
-
2.0
-
6.5
MHz
RAM read access
-
1.11 -
6.25 MHz
tSCL
SCL time
register read/write access
RAM write access
800 -
140 -
ns
800 -
140 -
ns
RAM read access
900 -
160 -
ns
tclk(H)
clock HIGH time
register read/write access
RAM write access
100 -
70
-
ns
100 -
70
-
ns
RAM read access
450 -
80
-
ns
tclk(L)
clock LOW time
register read/write access
RAM write access
400 -
70
-
ns
400 -
70
-
ns
RAM read access
450 -
80
-
ns
tr
rise time
tf
fall time
Pin SDA/CE
for SCL signal
for SCL signal
-
100 -
100 ns
-
100 -
100 ns
tsu(CE_N)
th(CE_N)
trec(CE_N)
tw(CE_N)
Pin SDI
CE_N set-up time
CE_N hold time
CE_N recovery time
CE_N pulse width
60
-
30
40
-
25
100 -
30
-
0.99 -
-
ns
-
ns
-
ns
0.99 s
tsu
th
Pin SDO
set-up time
hold time
set-up time for SDI data
hold time for SDI data
70
-
20
-
ns
70
-
20
-
ns
td(R)SDO
SDO read delay time CL = 50 pF
register read access
-
225 -
55
ns
RAM read access
-
410 -
55
ns
tdis(SDO)
tt(SDI-SDO)
SDO disable time
transition time from
SDI to SDO
to avoid bus conflict
[1] -
0
90
-
-
0
25
ns
-
ns
[1] No load value; bus is held up by bus capacitance; use RC time constant with application values.
PCF2127
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 8 — 19 December 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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