QL6250-E-7PS484M View Datasheet(PDF) - QuickLogic Corporation
Part Name
Description
MFG CO.
'QL6250-E-7PS484M' PDF : 37 Pages View PDF
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The 1149.1 standard requires the following three tests:
• Extest Instruction. The Extest instruction performs a PCB interconnect test. This test
places a device into an external boundary test mode, selecting the boundary scan register to
be connected between the TAP's Test Data In (TDI) and Test Data Out (TDO) pins. Boundary
scan cells are preloaded with test patterns (via the Sample/Preload Instruction), and input
boundary cells capture the input data for analysis.
• Sample/Preload Instruction. This instruction allows a device to remain in its functional
mode, while selecting the boundary scan register to be connected between the TDI and TDO
pins. For this test, the boundary scan register can be accessed via a data scan operation,
allowing users to sample the functional data entering and leaving the device.
• Bypass Instruction. The Bypass instruction allows data to skip a device's boundary scan
entirely, so the data passes through the bypass register. The Bypass instruction allows users
to test a device without passing through other devices. The bypass register is connected
between the TDI and TDO pins, allowing serial data to be transferred through a device
without affecting the operation of the device.
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