RH37C
TABLE 1A: ELECTRICAL CHARACTERISTICS
Note 1: Input offset voltage measurements are performed by automatic
test equipment approximately 0.5 seconds after application of power.
Note 2: Long-term input offset voltage stability refers to the average trend
line of offset voltage vs time over the first 30 days of operation. Excluding
the initial hour of operation, changes in VOS during the first 30 days are
typically 2.5µV. Refer to the typical performance curves.
Note 3: Sample tested to an LTPD of 15 on every lot. Contact factory for
100% testing of 10Hz voltage density noise.
Note 4: Parameter is guaranteed by design, characterization, or correlation
to other tested parameters.
Note 5: See test circuit and frequency response curve for 0.1Hz to 10Hz
tester on OP-27/OP-37 data sheet.
Note 6: See test circuit for current noise measurement on OP-27/OP-37
data sheet.
Note 7: The average input offset drift performance is within the specifica-
tions unnulled or when nulled with a pot having a range 8kΩ to 20kΩ.
Note 8: The RH37C’s inputs are protected by back-to-back diodes. Current
limiting resistors are not used in order to achieve low noise. If differential
input voltage exceeds ±0.7V, the input current should be limited to 25mA.
Note 9: VS = ±15V, VCM = 0V unless otherwise noted.
Note 10: TA = 25°C, VS = ±15V, VCM = 0V, unless otherwise noted.
TOTAL DOSE BIAS CIRCUIT
10k
15V
–
10k +
8V
–15V
WU
TYPICAL PERFOR A CE CHARACTERISTICS
Positive Slew Rate
25
VS = ±15V
RL = 2k
20 AVCL ≥ 5
15
10
5
Negative Slew Rate
25
VS = ±15V
RL = 2k
AVCL ≥ 5
20
15
10
0
1
10
100
1000
TOTAL DOSE KRAD (Si)
RH37C G01
0
1
10
100
1000
TOTAL DOSE KRAD (Si)
RH37C G02
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
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