SI5317C-C-GM View Datasheet(PDF) - Silicon Laboratories
Part Name
Description
MFG CO.
'SI5317C-C-GM' PDF : 50 Pages View PDF
Si5317
Table 4. AC Characteristics (Continued)
(VDD = 1.8 ±5%, 2.5 ±10%, or 3.3 V ±10%, TA = –40 to 85 ºC)
Parameter
Symbol
Test Condition
Min
LVCMOS Output Pins
Rise/Fall Times
tRF
CLOAD = 20 pf
—
See Figure 2
LOSn Trigger Window
Time to Clear LOS Alarm
LOSTRIG From LVST CKIN to LOS
Measured from appearance 90
tLOSCLR of valid CKIN to of LOS
alarm
Time to Clear LOL after LOS Cleared tCLRLOL fin unchanged and XA/XB —
stable.
LOS to LOL
PLL Performance
Lock Time
tLOCKHW RST with valid CKIN to —
LOL; BW = 100 Hz
Closed Loop Jitter Peaking
Jitter Tolerance
JPK
JTOL
BW determined by
BWSEL[1:0]
—
5000/
BW
Minimum Reset Pulse Width
Lock Time
Spurious Noise
tRSTMIN
1
tLOCKMP Reset b to of LOL
—
SPSPUR
Max spur @ n x f3
(n > 1, n x f3 < 100 MHz)
—
Typ
25
—
—
10
0.05
—
—
35
—
Max Units
—
ns
750 µs
220 ms
—
ms
1.2 sec
0.1
—
—
1000
–75
dB
ns pk-
pk
µs
ms
dBc
Preliminary Rev. 0.15
11
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