SPC5607BECLLR View Datasheet(PDF) - Freescale Semiconductor
Part Name
Description
MFG CO.
'SPC5607BECLLR' PDF : 92 Pages View PDF
Electrical characteristics
— Unexpected reset
— Critical data corruption (control registers...)
• Prequalification trials − Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the
software can be hardened to prevent unrecoverable errors occurring.
3.11.2 Electromagnetic interference (EMI)
The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC61967-1
standard, which specifies the general conditions for EMI measurements.
Table 27. EMI radiated emission measurement1,2
Symbol
C
Paramete
r
Conditions
Value
Unit
Min
Typ
Max
—
SR
— Scan
range
—
0.150
1000
MHz
fCPU
SR
— Operating
—
frequency
—
64
—
MHz
VDD_LV
SR
— LV
—
operating
voltages
—
1.28
—
V
SEMI
CC
T
Peak level VDD =
No PLL
—
5 V,
frequency
TA = 25 ° modulatio
C,
n
LQFP144
package
± 2% PLL
—
Test
conformin
g to IEC
frequency
modulatio
n
61967-2,
fOSC = 8
MHz/fCPU
= 64 MHz
—
18
dBµV
—
143
dBµV
1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your
local marketing representative.
3 All values need to be confirmed during device validation
3.11.3 Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine
its performance in terms of electrical sensitivity.
MPC5607B Microcontroller Data Sheet, Rev. 3
Freescale Semiconductor
41
Preliminary—Subject to Change Without Notice
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