SST29EE010-120-3C-E View Datasheet(PDF) - Silicon Storage Technology
Part Name
Description
MFG CO.
'SST29EE010-120-3C-E' PDF : 27 Pages View PDF
1 Megabit Page Mode EEPROM
SST29EE010, SST29LE010, SST29VE010
2.4
2.0
2.0
1
INPUT
REFERENCE POINTS
OUTPUT
0.8
0.8
0.4
2
304 MSW F12.0
3
AC test inputs are driven at VOH (2.4 VTTL) for a logic “1” and VOL (0.4 VTTL) for a logic “0”. Measurement reference
points for inputs and outputs are VIH (2.0 VTTL) and VIL (0.8 VTTL). Inputs rise and fall times (10% ↔ 90%) are <10
ns.
4
FIGURE 12: AC INPUT/OUTPUT REFERENCE WAVEFORMS
5
6
TO DUT
TEST LOAD EXAMPLE
TO TESTER
CL
RL LOW
7
VCC
8
9
RL HIGH
10
11
12
FIGURE 13: TEST LOAD EXAMPLE
13
304 MSW F13.0
14
15
16
© 1998 Silicon Storage Technology, Inc.
17
304-04 12/97
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