SST31LF021-70-4C-WH View Datasheet(PDF) - Silicon Storage Technology
Part Name
Description
MFG CO.
'SST31LF021-70-4C-WH' PDF : 24 Pages View PDF
EOL Data Sheet
2 Mbit Flash + 1 Mbit SRAM ComboMemory
SST31LF021 / SST31LF021E
VIHT
INPUT
VIT
REFERENCE POINTS
VOT
OUTPUT
VILT
1137 F11.1
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points
for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.
FIGURE 14: AC INPUT/OUTPUT REFERENCE WAVEFORMS
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
TO DUT
1137 F12.1
FIGURE 15: A TEST LOAD EXAMPLE
TO TESTER
CL
©2007 Silicon Storage Technology, Inc.
18
S71137-06-EOL
05/07
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