STTH5R06
Figure 3: Relative variation of thermal
impedance junction to case versus pulse
duration (TO-220AC, DPAK, D2PAK)
Zth(j-c)/Rth(j-c)
1.0
0.9
0.8
0.7
δ = 0.5
0.6
0.5
0.4 δ = 0.2
0.3 δ = 0.1
0.2
Single pulse
0.1
0.0
1.E-03
1.E-02
tp(s)
T
1.E-01
δ=tp/T
tp
1.E+00
Figure 4: Relative variation of thermal
impedance junction to case versus pulse
duration (TO-220FPAC)
Zth(j-c)/Rth(j-c)
1.0
0.9
0.8
0.7
0.6 δ = 0.5
0.5
0.4
0.3 δ = 0.2
0.2 δ = 0.1
0.1
Single pulse
0.0
1.E-03
1.E-02
tp(s)
1.E-01
T
δ=tp/T
1.E+00
tp
1.E+01
Figure 5: Peak reverse recovery current versus
dIF/dt (90% confidence)
IRM(A)
22
VR=400V
20 Tj=125°C
18
16
14
12
10
8
6
4
2
0
0
IF=0.5 x IF(AV)
IF=0.25 x IF(AV)
IF=IF(AV)
dIF/dt(A/µs)
200
400
600
IF=2 x IF(AV)
800
1000
Figure 6: Reverse recovery time versus dIF/dt
(90% confidence)
trr(ns)
80
70
60
50
40
30
20
10
0
0
IF=2 x IF(AV)
IF=IF(AV)
IF=0.5 x IF(AV)
dIF/dt(A/µs)
200
400
600
VR=400V
Tj=125°C
800
1000
Figure 7: Reverse recovery charges versus
dIF/dt (90% confidence)
Qrr(nC)
350
300
VR=400V
Tj=125°C
250
200
IF=2 x IF(AV)
IF=IF(AV)
150
100
IF=0.5 x IF(AV)
50
dIF/dt(A/µs)
0
0
200
400
600
800
1000
Figure 8: Softness factor versus dIF/dt (typical
values)
0.70
0.65
0.60
S factor
IF=IF(AV)
VR=400V
Tj=125°C
0.55
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0
200
dIF/dt(A/µs)
400
600
800
1000
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