TDA75612LV View Datasheet(PDF) - STMicroelectronics
Part Name
Description
MFG CO.
TDA75612LV
STMicroelectronics
'TDA75612LV' PDF : 35 Pages View PDF
Examples of bytes sequence
11
Examples of bytes sequence
TDA75612LV
1 - Turn-on diagnostic - Write operation
Start Address byte with D0 = 0 ACK IB1 with D6 = 1 ACK IB2 ACK STOP
2 - Turn-on diagnostic - Read operation
Start Address byte with D0 = 1 ACK DB1 ACK DB2 ACK DB3 ACK DB4 ACK STOP
The delay from 1 to 2 can be selected by software, starting from 1 ms
3a - Turn-on of the power amplifier with 30 dB gain, mute on, diagnostic defeat, CD = 2 %
.
Start Address byte with D0 = 0 ACK
3b - Turn-off of the power amplifier
IB1
X0000000
ACK
IB2
XXX1XX11
ACK STOP
Start Address byte with D0 = 0 ACK
4 - Offset detection procedure enable
IB1
ACK
IB2
ACK STOP
X0XXXXXX
XXX0XXXX
Start
Address byte with D0 = 0
ACK
IB1
XX1XX11X
ACK
IB2
XXX1XXXX
ACK STOP
5 - Offset detection procedure stop and reading operation (the results are valid only for the
offset detection bits (D2 of the bytes DB1, DB2, DB3, DB4)
.
Start Address byte with D0 = 1 ACK DB1 ACK DB2 ACK DB3 ACK DB4 ACK STOP
The purpose of this test is to check if a D.C. offset (2 V typ.) is present on the outputs,
produced by input capacitor with anomalous leakage current or humidity between pins.
The delay from 4 to 5 can be selected by software, starting from 1ms
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DocID025639 Rev 4
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