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VNH3ASP30-E View Datasheet(PDF) - STMicroelectronics

Part Name
Description
MFG CO.
VNH3ASP30-E
ST-Microelectronics
STMicroelectronics ST-Microelectronics
'VNH3ASP30-E' PDF : 34 Pages View PDF
VNH3ASP30-E
Electrical specifications
Table 14. Electrical transient requirements
ISO T/R - 7637/1
test pulse
Test level
I
Test level II
Test level
III
Test level IV
Test level delays and
impedance
1
-25V
-50V
-75V
-100V
2ms, 10
2
+25V
+50V
+75V
+100V
0.2ms, 10
3a
-25V
-50V
-100V
-150V
0.1µs, 50
3b
+25V
+50V
+75V
+100V
4
-4V
-5V
-6V
-7V
100ms, 0.01
5
+26.5V
+46.5V
+66.5V
+86.5V
400ms, 2
ISO T/R - 7637/1 Test levels result Test levels result Test levels result Test levels result
test pulse
I
II
III
IV
1
2
3a
C
C
C
C
3b
4
5(1)
E
E
E
1. For load dump exceeding the above value a centralized suppressor must be adopted.
Class
C
E
Contents
All functions of the device performed as designed after exposure to disturbance.
One or more functions of the device did not perform as designed after exposure to
disturbance and cannot be returned to proper operation without replacing the
device.
DocID10833 Rev 7
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