Qdatasheet_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

C8051F02X Datasheet PDF - Silicon Laboratories

C8051F020 image

Part Name
C8051F02X

Other PDF
  no available.

PDF
DOWNLOAD     

page
272 Pages

File Size
1.9 MB

MFG CO.
Silabs
Silicon Laboratories Silabs

SYSTEM OVERVIEW
The C8051F020/1/2/3 devices are fully integrated mixed-signal System-on-a-Chip MCUs with 64 digital I/O pins (C8051F020/2) or 32 digital I/O pins (C8051F021/3). Highlighted features are listed below; refer to Table 1.1 for specific product feature selection.

• High-Speed pipelined 8051-compatible CIP-51 microcontroller core (up to 25 MIPS)
• In-system, full-speed, non-intrusive debug interface (on-chip)
• True 12-bit (C8051F020/1) or 10-bit (C8051F022/3) 100 ksps 8-channel ADC with PGA and analog multiplexer
• True 8-bit ADC 500 ksps 8-channel ADC with PGA and analog multiplexer
• Two 12-bit DACs with programmable update scheduling
• 64k bytes of in-system programmable FLASH memory
• 4352 (4096 + 256) bytes of on-chip RAM
• External Data Memory Interface with 64k byte address space
• SPI, SMBus/I2C, and (2) UART serial interfaces implemented in hardware
• Five general purpose 16-bit Timers
• Programmable Counter/Timer Array with five capture/compare modules
• On-chip Watchdog Timer, VDD Monitor, and Temperature Sensor

ANALOG PERIPHERALS
- SAR ADC
   • 12-Bit (C8051F020/1)
   • 10-Bit (C8051F022/3)
   • ± 1 LSB INL
   • Programmable Throughput up to 100 ksps
   • Up to 8 External Inputs; Programmable as Single-Ended or Differential
   • Programmable Amplifier Gain: 16, 8, 4, 2, 1, 0.5
   • Data-Dependent Windowed Interrupt Generator
   • Built-in Temperature Sensor (± 3°C)
- 8-bit ADC
   • Programmable Throughput up to 500 ksps
   • 8 External Inputs
   • Programmable Amplifier Gain: 4, 2, 1, 0.5
- Two 12-bit DACs
   • Can Synchronize Outputs to Timers for Jitter-Free Wave form Generation
- Two Analog Comparators
- Voltage Reference
- Precision VDD Monitor/Brown-Out Detector

ON-CHIP JTAG DEBUG & BOUNDARY SCAN
- On-Chip Debug Circuitry Facilitates Full- Speed, Non Intrusive In-Circuit/In-System Debugging
- Provides Breakpoints, Single-Stepping, Watchpoints, Stack Monitor; Inspect/Modify Memory and Registers
- Superior Performance to Emulation Systems Using ICE Chips, Target Pods, and Sockets
- IEEE1149.1 Compliant Boundary Scan
- Low-Cost, Complete Development Kit

HIGH SPEED 8051 µC CORE
- Pipelined Instruction Architecture; Executes 70% of Instruction Set in 1 or 2 System Clocks
- Up to 25 MIPS Throughput with 25 MHz Clock
- 22 Vectored Interrupt Sources

MEMORY
- 4352 Bytes Internal Data RAM (4k + 256)
- 64k Bytes FLASH; In-System programmable in 512-byte Sectors
- External 64k Byte Data Memory Interface (programmable multiplexed or non-multiplexed modes)

DIGITAL PERIPHERALS
- 8 Byte-Wide Port I/O (C8051F020/2); 5V tolerant
- 4 Byte-Wide Port I/O (C8051F021/3); 5V tolerant
- Hardware SMBus™ (I2C™ Compatible), SPI™, and Two UART Serial Ports Available Concurrently
- Programmable 16-bit Counter/Timer Array with 5 Capture/Compare Modules
- 5 General Purpose 16-bit Counter/Timers
- Dedicated Watch-Dog Timer; Bi-directional Reset Pin

CLOCK SOURCES
- Internal Programmable Oscillator: 2-to-16 MHz
- External Oscillator: Crystal, RC, C, or Clock
- Real-Time Clock Mode using Timer 3 or PCA

SUPPLY VOLTAGE .......................... 2.7V TO 3.6V
- Typical Operating Current: 10 mA @ 20 MHz
- Multiple Power Saving Sleep and Shutdown Modes
   100-Pin TQFP and 64-Pin TQFP Packages Available Temperature Range: -40°C to +85°C

 


Share Link: GO URL

All Rights Reserved © qdatasheet.com  [ Privacy Policy ] [ Contact Us ]