ADuC7033
Parameter
ADC Low Power Reference
Internal VREF
Initial Accuracy
Initial Accuracy1
Temperature Coefficient1, 22
RESISTIVE ATTENUATOR
Divider Ratio
Resistor Mismatch Drift
ADC GROUND SWITCH
Resistance
Input Current
TEMPERATURE SENSOR25
Accuracy
POWER-ON RESET (POR)
POR Trip Level
POR Hysteresis
RESET Timeout from POR
LOW VOLTAGE FLAG (LVF)
LVF Level
POWER SUPPLY MONITOR (PSM)
PSM Trip Level
WATCHDOG TIMER (WDT)
Timeout Period1
Timeout Step Size
FLASH/EE MEMORY1
Endurance26
Data Retention27
DIGITAL INPUTS
Input Leakage Current
Input Pull-up Current
Input Capacitance
Input Leakage Current
Input Pull-Down Current
LOGIC INPUTS1
VINL, Input Low Voltage
VINH, Input High Voltage
CRYSTAL OSCILLATOR1
Logic Inputs, XTAL1 Only
VINL, Input Low Voltage
VINH, Input High Voltage
XTAL1 Capacitance
XTAL2 Capacitance
ON-CHIP OSCILLATORS
Low Power Oscillator
Accuracy28
Precision Oscillator
Accuracy
MCU CLOCK RATE
Test Conditions/Comments
Measured at TA = 25°C
Using ADCREF, measured at TA = 25°C
Min
−5
−300
Direct path to ground
20 kΩ resistor selected
After user calibration
MCU in power-down or standby mode
MCU in power-down or standby mode,
temperature range = −25°C to +65°C
Refers to voltage at VDD pin
Refers to voltage at VDD pin
Refers to voltage at VDD pin
32.768 kHz clock, 256 prescale
All digital inputs except NTRST
Input (high) = REG_DVDD
Input (low) = 0 V
NTRST only: input (low) = 0 V
NTRST only: input (high) = REG_DVDD
All logic inputs
10
2.85
1.9
0.008
10,000
20
−10
−80
−10
30
2.0
1.7
Includes drift data from 1000-hour life test
−3
Includes drift data from 1000-hour life test
8 programmable core clock selections within this
range (binary divisions 1, 2, 4, 8 . . . 64, 128)
−1
0.160
Typ
1.2
0.1
±150
24
3
10
20
±3
±2
Max
+5
+300
30
6
3.0
3.15
300
20
2.1
2.3
6.0
512
7.8
±1
+10
−20
−10
10
±1
+10
55
100
0.4
0.8
12
12
131.072
131.072
10.24
+3
+1
20.48
Unit
V
%
%
ppm/°C
ppm/°C
Ω
kΩ
mA
°C
°C
V
mV
ms
V
V
sec
ms
Cycles
Years
μA
μA
pF
μA
μA
V
V
V
V
pF
pF
kHz
%
kHz
%
MHz
Rev. B | Page 6 of 140