Signal Description
2.7
JTAG/ITP Signals
Table 2-12.JTAG/ITP Signals
Signal
Name
Description
Direction
TCK (Test Clock) provides the clock input for the
TCK
processor Test Bus (also known as the Test Access Port).
I
TDI (Test Data In) transfers serial test data into the
TDI
processor. TDI provides the serial input needed for JTAG
I
specification support.
TDO (Test Data Out) transfers serial test data out of the
TDO
processor. TDO provides the serial output needed for
O
JTAG specification support.
TMS (Test Mode Select) is a JTAG specification support
TMS
signal used by debug tools.
I
TRST# (Test Reset) resets the Test Access Port (TAP)
TRST#
logic. TRST# must be driven low during power on Reset.
Refer to the Nehalem Processor Debug Port Design Guide
I
for complete implementation details.
Type
TAP
OD
TAP
OD
TAP
OD
TAP
OD
TAP
OD
2.8
Error and Thermal Protection
Table 2-13.Error and Thermal Protection
Signal
Name
Description
Direction Type
PROCHOT# will go active when the processor
temperature monitoring sensor(s) detects that the
processor has reached its maximum safe operation
temperature
PROCHOT#
Output: This indicates that the processor (core0 and
core1) Thermal Control Circuit has been activated, if
enabled.
I: CMOS
I/O
O: OD
Input: This signal can also be driven to the processor to
activate the Thermal Control Circuit in core0 and core1.
This signal does not have on-die termination and must
be terminated on the system board, and 60 Ohm
resistor to Vcc.
Thermal Trip: The processor protects itself from
catastrophic overheating by use of an internal thermal
sensor. This sensor is set well above the normal
operating temperature to ensure that there are no false
THERMTRIP# trips. The processor will stop all execution when the
O
junction temperature exceeds approximately 125 C.
This is signaled to the system by the THERMTRIP# pin.
Refer to the appropriate platform design guide for
termination requirements.
Open
Drain
24
Datasheet