AU80610006225AASLBXC View Datasheet(PDF) - Intel
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MFG CO.
'AU80610006225AASLBXC' PDF : 80 Pages View PDF
Testability
10 Testability
10.1
In Intel Atom Processor D400 and D500 Series, testability for Automated Test
Equipment (ATE) board level testing has been implemented as JTAG boundary scan.
JTAG Boundary Scan
The Intel Atom Processor D400 and D500 Series add Boundary Scan ability compatible
with the IEEE 1149.1-2001 Standard (Teset Access Port and Boundary-Scan
Architecture) specification.
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Datasheet
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